Developped Software skills on top of Hardware background.
Troubleshooter for complex system issues, personaly owned production stop debug cooperating directly with major customers. Always succeed to find a solution to recover production.
Mentoring team engineers in day to day activities.
TI Power management IC Linux & U-boot drivers development/validation/upstream: tps65219, tps6594.
Zephyr driver: POC of porting a RF protocol (ESB) to a TeLink RiscV microcontroller.
BL ACME on Zephyr: use tinyiiod zephyr porting to interface ACME probe on esp32 in place of Linux BeagleBB + cape
NXP PowerTEC team: Low Power Audio development: MP3 playback custom implementation using audio subsystem block of imx845s. Hundreds mW down to 40mW. Released to production with Sony Walkman.
NXP PTEC: automated portable test framework for power measurement on use cases: Measurement can be reproduced confidently across team/time.
Thermo Regulated power Measurement Platform Definition, design and results study. Released open source. Presented at Embedded Linux Conference Lyon. Delivered to NXP and SiFive.
Automated test framework development for rare audio glitches detection on analog output to enable debug (detection and log)
PCIe Linux driver development: handle xDMA memory to memory transfers between Nvidia Xavier back-End and multiple Xilinx based board front-Ends with strong real time constraints.
OTA update mender integration into yocto distribution. Implementation, validation and release to end customer.
Mediatek IOT: power measurements and assessment on low power scenario (idle/suspend). Automated power measurement framework.
In charge of integrating, testing and delivering TEE product for different product lines.
Integration on platforms running various Rich OS: Android, Windows, Linux, "Yocto".
Direct Interface with customers: Qualcomm, AMD, LGE. On Site for board bring-up or debug camp. Remote for day to day activity.
TEE Core Feature development on customer request: MTK relocation, DRM Extension, Built-in capabilities for product/Test package.
Android secure framework: TA and Secure Driver development for AndroidO TeeKeyMaster3 (Verified Boot, Attestation and Gatekeeper).
DRM: Secure driver development for Qualcomm platforms using secure video path dedicated features.
Optimization: minimize memory requirements for running TEE on low end devices. Maximize performance by relocating critical section.
Test development: Test definition. Create Normal and Secure World components (Trusted Application and Drivers). functional testing and performance benchmarking.
QA: Integrate new devices into Continuous Integration farm. Analysis and debug of existing tests on various platforms. Integrate latest Android CTS into test framework.
Focus on the resolution of the most critical customer system issues. Join on site debug camps , interface with customer and provide solution to enable production ramp. Innovate through PE forum. Promote best practice within the team.
Customer on site support, enabling production ramp: Samsung Superior (September 2012) T1(June 2011), LG optimus3D (April 2012), Google GED & Phantasm (July 2011)RIM/QNX playbook (March 2011).
Provide guidance for customer to achieve ultimate performance based on thermal performance of their product (Apps note generation & Consulting).
Define a methodology for System margin validation & compensation on customer board.
In charge of a support team (5 people), technical lead and coordination.
Customer on site support Motorola USB DMA stall 2010, Nokia N900 PLD issue Nov 2009 and 3 different production stop crisis with Samsung (January09, March and May).
Assigning and driving team resources for issue resolution (870 requests closed), personal investment on most critical/complex investigation. Ramping successfully various customers in parallel: Palm Pre (2Q09) roadrunner (3Q10), Samsung OMNIA HD(3Q09) Archer (3Q10) S1 (RTP 4Q10), Nokia N900(4Q09), SEMC SATIO (1Q10), Mot Milestone (4Q09) DroidX (3Q10), Fujitsu Spinach (3Q10) Brutus (RTP 4Q10), Archos 5(4Q08).
Patent TI-37336 (granted 2009): System and method for secure mode for processors and memories on multiple semiconductors dies within a single semiconductor package